New Hosted Patents Search Offering Introduced on Engineering Village 2™
New York, N.Y. 24 April 2006 – Engineering Information (Ei) announces the introduction of Ei Patents to the Engineering Village 2 research and discovery platform. Ei Patents provides engineering researchers and scientists with an unmatched level of technical intelligence by utilizing powerful search functions and analytical tools alongside patents and databases of scientific literature. Ei Patents consists of patent applications and grants from the United States Patent and Trademark Office (USPTO) and European Patent Office (EPO).
Ei Patents addresses the need of scientists and engineering researchers to derive scientific and technical knowledge from patent literature. "Patents are a unique content source for technology and competitive intelligence as they often contain scientific information not published elsewhere" said Rafael Sidi, Vice President of Product Development, Engineering Information. "In the hands of engineers and researchers, products providing more meaningful access to patent information can accelerate problem solving, new product development and innovation."
Each patent record is a bibliographic reference containing a patent abstract, classification codes, patent citations and standard identifying metadata. Highly structured data enables powerful searching of patent content. Cited references link between a patent record and the other patents it cites. Cited reference searching allows users to search for any patents which cite a specific patent.
Ei Patents is unique in the way that it provides analytics and visualization of patent content at the search results page. Search results are clustered with record counts summarizing the most frequently occurring values among key data fields. These clustered fields or facets include inventor, assignee, classification codes, assignee country and year. The visualization of the patent content using faceted search allows researchers to gain insights and intelligence from the result display. Researchers can use this analytical tool to instantly learn of the most prolific inventor or organization patenting on a technology, discover new technology opportunities, and easily track their competitors.
Ei Patents allows researchers to analyze results from US and European patent databases along with results from scientific literature databases including Compendex® and Inspec®. Researchers benefit through being able to view patent references on a topic along with related publication from scholarly journals, conference papers, trade magazines and other sources. By viewing this information together, a researcher can review the work of an author/inventor across the outputs of their work.
"Simply being able to search through patents information on the free-web is not enough" explains Sidi. "Tools which help researchers to make sense of results, guide them toward more meaningful information and provide intelligence about a topic are really what engineering researchers require."